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Cited article:

The use of a Spherically Curved Crystal Spectrometer for X-ray Measurements on Electron Beam Ion Trap

Y Aglitskiy, F G Serpa, E S Meyer, et al.
Physica Scripta 58 (2) 178 (1998)
https://doi.org/10.1088/0031-8949/58/2/012

Radiative and inner-shell dielectronic recombination in a highly charged barium ion

D. J. McLaughlin, Y. Hahn, E. Takács, E. S. Meyer and J. D. Gillaspy
Physical Review A 54 (3) 2040 (1996)
https://doi.org/10.1103/PhysRevA.54.2040

The Oxford electron‐beam ion trap: A device for spectroscopy of highly charged ions

J. D. Silver, A. J. Varney, H. S. Margolis, et al.
Review of Scientific Instruments 65 (4) 1072 (1994)
https://doi.org/10.1063/1.1145066

A high-energy electron beam ion trap for production of high-charge high-Z ions

D.A. Knapp, R.E. Marrs, S.R. Elliott, E.W. Magee and R. Zasadzinski
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 334 (2-3) 305 (1993)
https://doi.org/10.1016/0168-9002(93)90790-O

Measurements of the contributions from high‐n dielectronic satellites to the Kα resonance line in heliumlike Fe24+

P. Beiersdorfer, M. B. Schneider, M. Bitter and S. von Goeler
Review of Scientific Instruments 63 (10) 5029 (1992)
https://doi.org/10.1063/1.1143482

Evaporative cooling of highly charged dysprosium ions in an enhanced electron-beam ion trap

B. M. Penetrante, J. N. Bardsley, M. A. Levine, D. A. Knapp and R. E. Marrs
Physical Review A 43 (9) 4873 (1991)
https://doi.org/10.1103/PhysRevA.43.4873

Evolution of ion-charge-state distributions in an electron-beam ion trap

B. M. Penetrante, J. N. Bardsley, D. DeWitt, M. Clark and D. Schneider
Physical Review A 43 (9) 4861 (1991)
https://doi.org/10.1103/PhysRevA.43.4861

Production of high-charge-state thorium and uranium ions in an electron-beam ion trap

D. Schneider, M. W. Clark, B. M. Penetrante, et al.
Physical Review A 44 (5) 3119 (1991)
https://doi.org/10.1103/PhysRevA.44.3119

High‐resolution x‐ray spectrometer for an electron beam ion trap

P. Beiersdorfer, R. E. Marrs, J. R. Henderson, et al.
Review of Scientific Instruments 61 (9) 2338 (1990)
https://doi.org/10.1063/1.1141361