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Cited article:

COMBINED FIELD ION AND FIELD ELECTRON EMISSION MICROSCOPY AND ENERGY-RESOLVED ATOM-PROBE SPECTROSCOPY OF Y Ba₂ Cu₃ O_7-x

N. ERNST, G. BOZDECH, A.J. MELMED

J. Phys. Colloques, 49 C6 (1988) C6-453-C6-458

DOI: https://doi.org/10.1051/jphyscol:1988677

PDF (2.197 MB)

This article has been cited by the following article(s):

Scanning probe nanostructuring of YBa[sub 2]Cu[sub 3]O[sub 7]: A corrosion induced abrasion

J. Boneberg, M. Böhmisch, M. Ochmann and P. Leiderer
Applied Physics Letters 71 (26) 3805 (1997)
https://doi.org/10.1063/1.120511

Surface modification during scanning tunneling microscope measurements on YBa2Cu3O7 thin films

Ulrich Geyer, Gunther von Minnigerode and Hans-Ulrich Krebs
Journal of Applied Physics 76 (12) 7774 (1994)
https://doi.org/10.1063/1.357955

Effect of switching over YBa2Cu3Ox thin films from the superconducting to the normal state under the action of field-emission currents

S. Shkuratov, S. Shilimanov and V. Skokov
Physical Review B 48 (9) 6456 (1993)
https://doi.org/10.1103/PhysRevB.48.6456