Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Investigation of the physical modeling of the gate-depletion effect

P. Habas and J.V. Faricelli
IEEE Transactions on Electron Devices 39 (6) 1496 (1992)
https://doi.org/10.1109/16.137331

Shallow defects responsible for GR noise in MOSFETs

D.C. Murray, A.G.R. Evans and J.C. Carter
IEEE Transactions on Electron Devices 38 (2) 407 (1991)
https://doi.org/10.1109/16.69924