Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

THE SERIES RESISTANCE OF SUBMICRON MOSFETs AND ITS EFFECT ON THEIR CHARACTERISTICS

F.M. KLAASSEN, P.T.J. BIERMANS, R.M.D. VELGHE

J. Phys. Colloques, 49 C4 (1988) C4-257-C4-260

DOI: https://doi.org/10.1051/jphyscol:1988453

PDF (507.2 KB)

This article has been cited by the following article(s):

Compact Trap-Assisted-Tunneling Model for Line Tunneling Field-Effect-Transistor Devices

Faraz Najam and Yun Seop Yu
Applied Sciences 10 (13) 4475 (2020)
https://doi.org/10.3390/app10134475

A physically based compact model of partially depleted SOI MOSFETs for analog circuit simulation

M.S.L. Lee, B.M. Tenbroek, W. Redman-White, J. Benson and M.J. Uren
IEEE Journal of Solid-State Circuits 36 (1) 110 (2001)
https://doi.org/10.1109/4.896235

R.M.D.A. Velghe, D.B.M. Klaassen and F.M. Klaassen
485 (1993)
https://doi.org/10.1109/IEDM.1993.347305

T. Smedes and F.M. Klaassen
197 (1990)
https://doi.org/10.1109/IEDM.1990.237194

H.P. Tuinhout
61 (1989)
https://doi.org/10.1109/ICMTS.1989.39282