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Cited article:

A Novel Approach for the Modeling of the Dynamic ON-State Resistance of GaN-HEMTs

Mathias C. J. Weiser, Jan Hückelheim and Ingmar Kallfass
IEEE Transactions on Electron Devices 68 (9) 4302 (2021)
https://doi.org/10.1109/TED.2021.3098498

An Active Bias Network for the Characterization of Low-Frequency Dispersion in High-Power Microwave Electron Devices

Corrado Florian, Pier Andrea Traverso, Alberto Santarelli and Fabio Filicori
IEEE Transactions on Instrumentation and Measurement 62 (10) 2857 (2013)
https://doi.org/10.1109/TIM.2013.2263911