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Cited article:

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Back-gate effects on DC performance and carrier transport in 22 nm FDSOI technology down to cryogenic temperatures

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Pronounced Optoelectronic Effect in n–n ReS2 Homostructure

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Impact of Series Resistance on Bulk CMOS Current Matching Over the 5–300K Temperature Range

Nguyen Cong Dao, Abdallah El Kass, Craig T. Jin and Philip H. W. Leong
IEEE Electron Device Letters 38 (7) 847 (2017)
https://doi.org/10.1109/LED.2017.2709545