Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

HOT CARRIER STRESS INDUCED CHANGES IN MOST TRANSCONDUCTANCE STRUCTURE

C. BERGONZONI, R. BENECCHI, P. CAPRARA

J. Phys. Colloques, 49 C4 (1988) C4-779-C4-782

DOI: https://doi.org/10.1051/jphyscol:19884163

PDF (414.2 KB)

This article has been cited by the following article(s):

The influence of gate edge shape on the degradation in hot-carrier stressing of n-channel transistors

B.S. Doyle, C. Bergonzoni and A. Boudou
IEEE Electron Device Letters 12 (7) 363 (1991)
https://doi.org/10.1109/55.103608