Articles citing this article

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The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Design and characterization of high voltage devices integrated in a standard CMOS technology

B. Villard, F. Calmon and C. Gontrand
The European Physical Journal Applied Physics 16 (2) 113 (2001)
https://doi.org/10.1051/epjap:2001200

Detection and localization of gate oxide shorts in MOS transistors by optical-beam-induced current

E. Zanoni, G. Spiazzi, G. Dalla Libera, et al.
IEEE Transactions on Electron Devices 38 (2) 417 (1991)
https://doi.org/10.1109/16.69925