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Temperature dependence of the channel hot-carrier degradation of n-channel MOSFET's
P. Heremans, G. Van den Bosch, R. Bellens, G. Groeseneken and H.E. Maes IEEE Transactions on Electron Devices 37(4) 980 (1990) https://doi.org/10.1109/16.52433
A new self-consistent modeling approach to investigating MOSFET degradation