Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

NON-DESTRUCTIVE CHARACTERISATION OF DEVICE PROCESSING OF SILICON-ON-SAPPHIRE (SOS) WAFERS

C. PICKERING, S. SHARMA, S. COLLINS, A.G. MORPETH, G.R. TERRY, A.M. HODGE

J. Phys. Colloques, 49 C4 (1988) C4-55-C4-58

DOI: https://doi.org/10.1051/jphyscol:1988410

PDF (930.2 KB)

This article has been cited by the following article(s):

Spectroscopic Ellipsometry as a Non-Destructive Technique for Characterization of Atomic-Scale Interfaces

J.L. Stehle, J.P. Piel, J.H. Lecat, C. Pickering and L.C. Hammond
MRS Proceedings 159 (1989)
https://doi.org/10.1557/PROC-159-459