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Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Probing a crystal's short‐range structure and local orbitals by Resonant X‐ray Diffraction methods

Matthias Zschornak, Carsten Richter, Melanie Nentwich, et al.
Crystal Research and Technology 49 (1) 43 (2014)
https://doi.org/10.1002/crat.201300430

Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures

V. Favre-Nicolin, M. G. Proietti, C. Leclere, et al.
The European Physical Journal Special Topics 208 (1) 189 (2012)
https://doi.org/10.1140/epjst/e2012-01619-x

Interfacial structure in (111) Au:Ni multilayers investigated by anomalous x-ray diffraction

T. Bigault, F. Bocquet, S. Labat, O. Thomas and H. Renevier
Physical Review B 64 (12) (2001)
https://doi.org/10.1103/PhysRevB.64.125414

X-ray analysis of the short-range order in the ordered-alloy domains of epitaxial (Ga,In)P layers by diffraction anomalous fine structure of superlattice reflections

Dirk C. Meyer, Kurt Richter, Peter Paufler and Gerald Wagner
Physical Review B 59 (23) 15253 (1999)
https://doi.org/10.1103/PhysRevB.59.15253

Diffraction-anomalous-fine-structure spectroscopy applied to the study of III-V strained semiconductors

M. G. Proietti, H. Renevier, J. L. Hodeau, et al.
Physical Review B 59 (8) 5479 (1999)
https://doi.org/10.1103/PhysRevB.59.5479