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Cited article:

THIN FILM COMPOSITIONAL ANALYSIS BY LOW-ENERGY ELECTRON-INDUCED X-RAY SPECTROMETRY (LEEIXS). NEW APPLICATIONS

M. ROMAND, M. CHARBONNIER, F. GAILLARD

J. Phys. Colloques, 48 C9 (1987) C9-87-C9-90

DOI: https://doi.org/10.1051/jphyscol:1987912

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This article has been cited by the following article(s):

Application of X‐ray emission spectrometry (LEEIXS) to the study of insulator surface—molecular characterization of some metallic oxides or compounds

F. Gaillard and M. Romand
Surface and Interface Analysis 16 (1-12) 429 (1990)
https://doi.org/10.1002/sia.740160189