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Cited article:

T.E.M. TECHNIQUES FOR THE ATOMIC LEVEL CHARACTERISATION OF NANOMETRE SCALE MULTILAYERS

W.M. STOBBS

J. Phys. Colloques, 48 C5 (1987) C5-33-C5-40

DOI: https://doi.org/10.1051/jphyscol:1987505

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This article has been cited by the following article(s):

Correlation of electronic and structural data for a superlattice tunnel diode

R A Davies, E G Bithell, A Chew, et al.
Semiconductor Science and Technology 4 (1) 35 (1989)
https://doi.org/10.1088/0268-1242/4/1/007