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Cited article:

Reactivity of Surface Species in Heterogeneous Catalysts Probed by In Situ X-ray Absorption Techniques

Silvia Bordiga, Elena Groppo, Giovanni Agostini, Jeroen A. van Bokhoven and Carlo Lamberti
Chemical Reviews 113 (3) 1736 (2013)
https://doi.org/10.1021/cr2000898

Identifying and quantifying point defects in semiconductors using x-ray-absorption spectroscopy: Si-doped GaAs

S. Schuppler, D. L. Adler, L. N. Pfeiffer, et al.
Physical Review B 51 (16) 10527 (1995)
https://doi.org/10.1103/PhysRevB.51.10527

Vibrational correlation functions of hydrogen-terminated C(111)-(1×1) and Si(111)-(1×1) surfaces

B. Sandfort, A. Mazur and J. Pollmann
Physical Review B 51 (11) 7168 (1995)
https://doi.org/10.1103/PhysRevB.51.7168

Surface extended x-ray-absorption fine-structure study of the (1 monolayer Sb)/GaP(110) interface

K. Miyano, J. Woicik, T. Kendelewicz, et al.
Physical Review B 47 (11) 6444 (1993)
https://doi.org/10.1103/PhysRevB.47.6444

Determination of intramolecular bond lengths of low-Zmolecules in the gas phase, condensed, and chemisorbed states using extended x-ray absorption fine structure

N. Pangher, H. M. Köppe, J. Feldhaus and J. Haase
Physical Review Letters 71 (26) 4365 (1993)
https://doi.org/10.1103/PhysRevLett.71.4365

Transferability of phase shifts for extended x-ray-absorption fine-structure studies of metal sulfides and sulfur on nickel surfaces

D. R. Warburton, D. Purdie, C. A. Muryn, et al.
Physical Review B 45 (20) 12043 (1992)
https://doi.org/10.1103/PhysRevB.45.12043

Origin of the x-ray-absorption fine structure in photon-stimulated ion desorption from Si-adsorbate systems

R. McGrath, I. McGovern, D. Warburton, et al.
Physical Review B 45 (16) 9327 (1992)
https://doi.org/10.1103/PhysRevB.45.9327

Surface extended-x-ray-absorption fine structure and scanning tunneling microscopy of Si(001)2×1-Sb

M. Richter, J. C. Woicik, J. Nogami, et al.
Physical Review Letters 65 (27) 3417 (1990)
https://doi.org/10.1103/PhysRevLett.65.3417

Evidence of Eightfold Coordination for Co Atoms at the CoSi2/Si(111) Interface

G. Rossi, X. Jin, A. Santaniello, P. DePadova and D. Chandesris
Physical Review Letters 62 (2) 191 (1989)
https://doi.org/10.1103/PhysRevLett.62.191

Origin and structural sensitivity of surface Auger extended fine structure

T. Tyliszczak, A. P. Hitchcock and M. De Crescenzi
Physical Review B 38 (8) 5768 (1988)
https://doi.org/10.1103/PhysRevB.38.5768

Surface structure determination by SEXAFS: The reliability of bond lengths and coordination numbers from multi-shell analyses

D.J. Holmes, D.R. Batchelor and D.A. King
Surface Science 199 (3) 476 (1988)
https://doi.org/10.1016/0039-6028(88)90916-8

Multiple-scattering effects in surface extended x-ray absorption fine structure

D. Arvanitis, K. Baberschke and L. Wenzel
Physical Review B 37 (12) 7143 (1988)
https://doi.org/10.1103/PhysRevB.37.7143