Articles citing this article

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Cited article:

Composition and thermal-annealing-induced short-range ordering changes in amorphous hydrogenated silicon carbide films as investigated by extended x-ray-absorption fine structure and infrared absorption

M. El Khakani, D. Guay, M. Chaker and X. Feng
Physical Review B 51 (8) 4903 (1995)
https://doi.org/10.1103/PhysRevB.51.4903

Structural investigation of a-Si and a-Si:H using x-ray-absorption spectroscopy at the Si K edge

A. Filipponi, F. Evangelisti, M. Benfatto, S. Mobilio and C. Natoli
Physical Review B 40 (14) 9636 (1989)
https://doi.org/10.1103/PhysRevB.40.9636

Structural determination of crystalline silicon by extended energy-loss fine-structure spectroscopy

M. De Crescenzi, L. Lozzi, P. Picozzi, et al.
Physical Review B 39 (12) 8409 (1989)
https://doi.org/10.1103/PhysRevB.39.8409

Extended x-ray-absorption and electron-energy-loss fine-structure studies of the local atomic structure of amorphous unhydrogenated and hydrogenated silicon carbide

Alain Kaloyeros, Richard Rizk and John Woodhouse
Physical Review B 38 (18) 13099 (1988)
https://doi.org/10.1103/PhysRevB.38.13099