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Cited article:

X-RAY ABSORPTION STUDIES OF AMORPHOUS SEMICONDUCTORS

D.E. SAYERS, M.A. PAESLER

J. Phys. Colloques, 47 C8 (1986) C8-349-C8-356

DOI: https://doi.org/10.1051/jphyscol:1986869

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Structural studies of argon-sputtered amorphous carbon films by means of extended x-ray-absorption fine structure

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