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Cited article:

A REFLECTIVITY AND EXAFS STUDY OF LAYERED STRUCTURES

D. JIANG, N. ALBERDING, A.J. SEARY, E.D. CROZIER

J. Phys. Colloques, 47 C8 (1986) C8-861-C8-864

DOI: https://doi.org/10.1051/jphyscol:19868166

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This article has been cited by the following article(s):

X–ray absorption fine structure (XAFS) of Si wafer measured using total reflection X–rays

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Structure determination of metastable epitaxial Cu layers on Ag(001) by glancing-incidence x-ray-absorption fine structure

D. T. Jiang, E. D. Crozier and B. Heinrich
Physical Review B 44 (12) 6401 (1991)
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A gas-flow electron yield detector for glancing-incidence EXAFS

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Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 294 (3) 666 (1990)
https://doi.org/10.1016/0168-9002(90)90311-S

Angular scanning stage for glancing‐incidence surface EXAFS

D. T. Jiang, N. Alberding, A. J. Seary and E. D. Crozier
Review of Scientific Instruments 59 (1) 60 (1988)
https://doi.org/10.1063/1.1139966