Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

X–ray absorption fine structure (XAFS) of Si wafer measured using total reflection X–rays

Jun Kawai, Shinjiro Hayakawa, Yoshinori Kitajima and Yohichi Gohshi
Spectrochimica Acta Part B: Atomic Spectroscopy 54 (1) 215 (1999)
https://doi.org/10.1016/S0584-8547(98)00209-2

Structure determination of metastable epitaxial Cu layers on Ag(001) by glancing-incidence x-ray-absorption fine structure

D. Jiang, E. Crozier and B. Heinrich
Physical Review B 44 (12) 6401 (1991)
https://doi.org/10.1103/PhysRevB.44.6401

Glancing-angle extended x-ray-absorption fine structure and reflectivity studies of interfacial regions

S. Heald, H. Chen and J. Tranquada
Physical Review B 38 (2) 1016 (1988)
https://doi.org/10.1103/PhysRevB.38.1016