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Cited article:

Sputtering of AIIIBV compound semiconductors under bombardment with atomic and cluster bismuth ions

A. Tolstoguzov, A.E. Ieshkin, I.N. Kutlusurin and P. Mazarov
Results in Surfaces and Interfaces 19 100491 (2025)
https://doi.org/10.1016/j.rsurfi.2025.100491

Focused ion‐beam milling of a submicrometer aperture for a hydrodynamic Josephson‐effect experiment

P. Sudraud, P. Ballongue, E. Varoquaux and O. Avenel
Journal of Applied Physics 62 (6) 2163 (1987)
https://doi.org/10.1063/1.339517