Articles citing this article

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The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Charged particle single nanometre manufacturing

Philip D Prewett, Cornelis W Hagen, Claudia Lenk, et al.
Beilstein Journal of Nanotechnology 9 2855 (2018)
https://doi.org/10.3762/bjnano.9.266

Nanometer-Scale Surface Modification Using the Scanning Probe Microscope:  Progress since 1991

R. M. Nyffenegger and R. M. Penner
Chemical Reviews 97 (4) 1195 (1997)
https://doi.org/10.1021/cr960069i

Scanning probe surface modification

Thomas S. Corbitt, Richard M. Crooks, Claudia B. Ross, Mark J. Hampden‐Smith and Jonathan K. Schoer
Advanced Materials 5 (12) 935 (1993)
https://doi.org/10.1002/adma.19930051213

Scanning tunneling microscope as a micromechanical tool

M. A. McCord and R. F. W. Pease
Applied Physics Letters 50 (10) 569 (1987)
https://doi.org/10.1063/1.98137