Articles citing this article

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Cited article:

On the structure and chemistry of Ni3Al on an atomic scale via atom-probe field-ion microscopy

G.P.E.M. Van Bakel, K. Hariharan and D.N. Seidman
Applied Surface Science 90 (1) 95 (1995)
https://doi.org/10.1016/0169-4332(95)00061-5

Automatic temperature‐controlled helium‐vapor cryostat for atom‐probe field‐ion microscopy studies

G. P. E. M. Van Bakel, D. A. Shashkov and D. N. Seidman
Review of Scientific Instruments 66 (7) 3774 (1995)
https://doi.org/10.1063/1.1145436

Reply to comment by H. Numakura: On the quantitative analysis of nanometer diameter MgO precipitates via atom-probe field-ion microscopy

Ho Jang, Dmitriy A. Shashkov, David K. Chan, David N. Seidman and Karl L. Merkle
Scripta Metallurgica et Materialia 30 (5) 663 (1994)
https://doi.org/10.1016/0956-716X(94)90448-0

New time‐of‐flight electronics for atom‐probe field‐ion microscopy

D. K. Chan, B. M. Davis and D. N. Seidman
Review of Scientific Instruments 65 (6) 1973 (1994)
https://doi.org/10.1063/1.1144798

Systematic procedures for atom‐probe field‐ion microscopy studies of grain boundary segregation

B. W. Krakauer and D. N. Seidman
Review of Scientific Instruments 63 (9) 4071 (1992)
https://doi.org/10.1063/1.1143214