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Cited article:

Stacking Fault Segregation Imaging With Analytical Field Ion Microscopy

Felipe F. Morgado, Leigh T Stephenson, Shalini Bhatt, Christoph Freysoldt, Steffen Neumeier, Shyam Katnagallu, Aparna P A Subramanyam, Isabel Pietka, Thomas Hammerschmidt, François Vurpillot and Baptiste Gault
Microscopy and Microanalysis 31 (1) (2025)
https://doi.org/10.1093/mam/ozae105

Atomic scale studies of solute-atom segregation at grain boundaries: Experiments and simulations

D.N. Seidman, B.W. Krakauer and D. Udler
Journal of Physics and Chemistry of Solids 55 (10) 1035 (1994)
https://doi.org/10.1016/0022-3697(94)90123-6