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Cited article:

AN ATOM-PROBE STUDY OF III-V COMPOUND SEMICONDUCTORS

T. Sakurai, T. Hashizume, A. Jimbo, T. Sakata

J. Phys. Colloques, 45 C9 (1984) C9-453-C9-458

DOI: https://doi.org/10.1051/jphyscol:1984975

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This article has been cited by the following article(s):

On the reliable analysis of indium mole fraction within InxGa1−xN quantum wells using atom probe tomography

James R. Riley, Theeradetch Detchprohm, Christian Wetzel and Lincoln J. Lauhon
Applied Physics Letters 104 (15) (2014)
https://doi.org/10.1063/1.4871510