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Cited article:

THE COMPLEMENTARY USE OF ATOM PROBE FIELD ION MICROSCOPY AND ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY FOR THE STUDY OF A Ni-BASE SUPERALLOY

A.J. Melmed, M.E. Twigg, R. Klein, M.J. Kaufman, H.L. Fraser

J. Phys. Colloques, 45 C9 (1984) C9-373-C9-378

DOI: https://doi.org/10.1051/jphyscol:1984962

PDF (1.116 MB)

This article has been cited by the following article(s):

Phase Transformation and Segregation to Lattice Defects in Ni-Base Superalloys

Didier Blavette, Emmanuel Cadel, Cristelle Pareige, Bernard Deconihout and Pierre Caron
Microscopy and Microanalysis 13 (6) 464 (2007)
https://doi.org/10.1017/S143192760707078X