Articles citing this article

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Cited article:

Field Ion Emission in an Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light

Ann N. Chiaramonti, Luis Miaja-Avila, Benjamin W. Caplins, et al.
Microscopy and Microanalysis 26 (2) 258 (2020)
https://doi.org/10.1017/S1431927620000203

Comparing the Consistency of Atom Probe Tomography Measurements of Small-Scale Segregation and Clustering Between the LEAP 3000 and LEAP 5000 Instruments

Tomas L. Martin, Andrew J. London, Benjamin Jenkins, et al.
Microscopy and Microanalysis 23 (2) 227 (2017)
https://doi.org/10.1017/S1431927617000356

Effects of detector dead-time on quantitative analyses involving boron and multi-hit detection events in atom probe tomography

Frederick Meisenkothen, Eric B. Steel, Ty J. Prosa, Karen T. Henry and R. Prakash Kolli
Ultramicroscopy 159 101 (2015)
https://doi.org/10.1016/j.ultramic.2015.07.009

Correction of dead time effects in laser-induced desorption time-of-flight mass spectrometry: Applications in atom probe tomography

Thomas Stephan, Philipp R. Heck, Dieter Isheim and Josiah B. Lewis
International Journal of Mass Spectrometry 379 46 (2015)
https://doi.org/10.1016/j.ijms.2014.12.006