Articles citing this article

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Cited article:

Application of X‐ray emission spectrometry (LEEIXS) to the study of insulator surface—molecular characterization of some metallic oxides or compounds

F. Gaillard and M. Romand
Surface and Interface Analysis 16 (1-12) 429 (1990)
https://doi.org/10.1002/sia.740160189

Surface and near‐surface chemical characterization by low‐energy electron‐induced X‐ray spectrometry (LEEIXS): A review

M. Romand, R. Bador, M. Charbonnier and F. Gaillard
X-Ray Spectrometry 16 (1) 7 (1987)
https://doi.org/10.1002/xrs.1300160104