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Cited article:

DEPTH RESOLUTION IN ION SPUTTERING - AN ASPECT OF QUANTITATIVEMICROANALYSIS

J. Giber, D. Marton, J. László

J. Phys. Colloques, 45 C2 (1984) C2-115-C2-118

DOI: https://doi.org/10.1051/jphyscol:1984226

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This article has been cited by the following article(s):

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AES sputtering depth profile analysis of C/W layered synthetic microstructures

D. Roux, A. Rolland, P. Renucci and J.P. Petrakian
Applied Surface Science 28 (2) 93 (1987)
https://doi.org/10.1016/0169-4332(87)90056-0