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Cited article:

COMPARISON OF SECONDARY ION MASS SPECTROMETRY (SIMS) WITH ELECTRON MICROPROBE ANALYSIS (EPMA) AND OTHER THIN FILM ANALYTICAL METHODS

H.W. Werner, A.P. von Rosenstiel

J. Phys. Colloques, 45 C2 (1984) C2-103-C2-113

DOI: https://doi.org/10.1051/jphyscol:1984225

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This article has been cited by the following article(s):

Alkali-metal-based molecular-ion secondary ion mass spectrometry for precise quantitative analysis of low-dimensional materials without standards

Purushottam Chakraborty
International Journal of Modern Physics B 39 (05) (2025)
https://doi.org/10.1142/S021797922450440X