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Cited article:

ELECTRON PROBE MICROANALYSIS OF SUBMICRON ALLOY FILMS

P. Willich

J. Phys. Colloques, 45 C2 (1984) C2-621-C2-624

DOI: https://doi.org/10.1051/jphyscol:19842145

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This article has been cited by the following article(s):

Composition and thickness of submicron metal coatings and multilayers on Si determined by EPMA

P. Willich and D. Obertop
Surface and Interface Analysis 13 (1) 20 (1988)
https://doi.org/10.1002/sia.740130106

Quantitative electron microprobe determination of oxygen in metal layers covered by surface oxide films

P. Willich, D. Obertop and H. J. Tolle
X-Ray Spectrometry 14 (2) 84 (1985)
https://doi.org/10.1002/xrs.1300140209