Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Measurement of local recombination activity in high diffusion length semiconductors

Friedemann D. Heinz, Maximilian Oezkent, Clara Rittmann, et al.
Solar Energy Materials and Solar Cells 260 112477 (2023)
https://doi.org/10.1016/j.solmat.2023.112477

Understanding and optimizing EBIC pn-junction characterization from modeling insights

Ruinan Zhou, Mingzhe Yu, David Tweddle, et al.
Journal of Applied Physics 127 (2) (2020)
https://doi.org/10.1063/1.5139894

A theoretical study of the charge collection contrast of localized semiconductor defects with arbitrary recombination activity

C Donolato
Semiconductor Science and Technology 7 (1) 37 (1992)
https://doi.org/10.1088/0268-1242/7/1/007

Comment on ‘‘A contribution to the theory of beam-induced current characterization of dislocations’’ [J. Appl. Phys. 69, 6387 (1991)]

C. Donolato
Journal of Applied Physics 70 (12) 7657 (1991)
https://doi.org/10.1063/1.349680

Electron beam induced current and cathodoluminescence study of the recombination activity of stacking faults and hillocks in hydride vapor phase epitaxy InP

G. Attolini, C. Frigeri, C. Pelosi and G. Salviati
Applied Physics Letters 49 (3) 167 (1986)
https://doi.org/10.1063/1.97213