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This article has been cited by the following article(s):
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Microellipsometry study of plasmonic properties of metal–insulator–metal structures with ordered lattices of nanoparticles
E. Bortchagovsky, Yu. Demydenko, A. Bogoslovskaya, et al. Journal of Applied Physics 129(12) (2021) https://doi.org/10.1063/5.0039164
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Deficiency of Standard Effective‐Medium Approximation for Ellipsometry of Layers of Nanoparticles
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Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO2 substrate