Articles citing this article

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Cited article:

The effect of long-correlation-length surface roughness on the ellipsometric parameters of reflected light

I. L Morris and T. E Jenkins
Europhysics Letters (EPL) 34 (1) 55 (1996)
https://doi.org/10.1209/epl/i1996-00415-5

Ellipsometry of rough silicon surfaces: comment on the 'roughness of heteroepitaxial silicon-on-sapphire'

C Pickering, R Greef and A M Hodge
Semiconductor Science and Technology 4 (7) 574 (1989)
https://doi.org/10.1088/0268-1242/4/7/014