Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Optical Characterization of Thin Solid Films

Miloslav Ohlídal, Jiří Vodák and David Nečas
Springer Series in Surface Sciences, Optical Characterization of Thin Solid Films 64 107 (2018)
https://doi.org/10.1007/978-3-319-75325-6_5

Mapping of properties of thin plasma jet films using imaging spectroscopic reflectometry

D Nečas, V Čudek, J Vodák, et al.
Measurement Science and Technology 25 (11) 115201 (2014)
https://doi.org/10.1088/0957-0233/25/11/115201

Imaging ellipsometry revisited: Developments for visualization of thin transparent layers on silicon substrates

Gang Jin, Roger Jansson and Hans Arwin
Review of Scientific Instruments 67 (8) 2930 (1996)
https://doi.org/10.1063/1.1147074

Real time optical profilometry as a probe of rates of laser‐induced chemical vapor deposition

Paul B. Comita and Toivo T. Kodas
Journal of Applied Physics 62 (6) 2280 (1987)
https://doi.org/10.1063/1.339484