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Cited article:

DETERMINATION OF THE OPTICAL PROPERTIES OF GaAs AND InP BY MULTIPLE ANGLE OF INCIDENCE ELLIPSOMETRY

H.W. Dinges

J. Phys. Colloques, 44 C10 (1983) C10-39-C10-43

DOI: https://doi.org/10.1051/jphyscol:19831007

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This article has been cited by the following article(s):

Study of the influence of native oxide layers on atomic force microscopy imaging of semiconductor surfaces

H. Bluhm, U. D. Schwarz, F. Herrmann and P. Paufler
Applied Physics A Solids and Surfaces 59 (1) 23 (1994)
https://doi.org/10.1007/BF00348415