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Cited article:

Temperature-Dependent Spectroscopic Ellipsometry of Thin Polymer Films

Barbara Hajduk, Henryk Bednarski and Barbara Trzebicka
The Journal of Physical Chemistry B 124 (16) 3229 (2020)
https://doi.org/10.1021/acs.jpcb.9b11863

Measurement of the thickness of the surface layer on amorphous Ge films using spectroscopic ellipsometry: validity of effective medium modeling

Patrick J. McMarr and J. R. Blanco
Applied Optics 27 (20) 4265 (1988)
https://doi.org/10.1364/AO.27.004265

Optical characterization of low-index transparent thin films on transparent substrates by spectroscopic ellipsometry

Kenneth M. Gustin
Applied Optics 26 (18) 3796 (1987)
https://doi.org/10.1364/AO.26.003796