Articles citing this article

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Cited article:

The effect of long-correlation-length surface roughness on the ellipsometric parameters of reflected light

I. L Morris and T. E Jenkins
Europhysics Letters (EPL) 34 (1) 55 (1996)
https://doi.org/10.1209/epl/i1996-00415-5

Phase modulated ellipsometry from the ultraviolet to the infrared: In situ application to the growth of semiconductors

B. Drévillon
Progress in Crystal Growth and Characterization of Materials 27 (1) 1 (1993)
https://doi.org/10.1016/0960-8974(93)90021-U

Automatic rotating element ellipsometers: Calibration, operation, and real‐time applications

R. W. Collins
Review of Scientific Instruments 61 (8) 2029 (1990)
https://doi.org/10.1063/1.1141417

Ellipsometry of rough silicon surfaces: comment on the 'roughness of heteroepitaxial silicon-on-sapphire'

C Pickering, R Greef and A M Hodge
Semiconductor Science and Technology 4 (7) 574 (1989)
https://doi.org/10.1088/0268-1242/4/7/014

Optical characterization of low-index transparent thin films on transparent substrates by spectroscopic ellipsometry

Kenneth M. Gustin
Applied Optics 26 (18) 3796 (1987)
https://doi.org/10.1364/AO.26.003796