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Cited article:

SHORT RANGE STRUCTURE AND SOME PHYSICAL PROPERTIES OF THE GLASSES IN THE SYSTEM Na₂O-Ga₂O₃-SiO₂

S. Goto, T. Hanada, R. Ota, N. Soga, N. Iwamoto, N. Umesaki

J. Phys. Colloques, 43 C9 (1982) C9-111-C9-114

DOI: https://doi.org/10.1051/jphyscol:1982921

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Advanced Electronic Materials 3 (3) (2017)
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Analysis of electronic structure of amorphous InGaZnO/SiO2 interface by angle-resolved X-ray photoelectron spectroscopy

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Journal of Applied Physics 114 (16) (2013)
https://doi.org/10.1063/1.4828869