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Cited article:

RAMAN SPECTROSCOPY CHARACTERIZATION OF POLYCRYSTALLINE GaP THIN FILMS GROWN BY MO-CVD PROCESS USING [Et₂Ga - PEt₂]₃ AS ONLY SOURCE

F. Maury, M. Combes, G. Constant, R. Carles, J.B. Renucci

J. Phys. Colloques, 43 C1 (1982) C1-347-C1-352

DOI: https://doi.org/10.1051/jphyscol:1982146

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Comportement à deux modes de Ga(x)In(1 - x)P ? Diffusion Raman résonnante par les modes rendus actifs par le désordre

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