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Cited article:

Real Time Observation of the Directional Solidification of Multicrystalline Silicon: X-ray Imaging Characterization

A. Tandjaoui, N. Mangelinck-Noël, G. Reinhart, et al.
Energy Procedia 27 82 (2012)
https://doi.org/10.1016/j.egypro.2012.07.033

An investigation of the thermal stability of the interfacial oxide in polycrystalline silicon emitter bipolar transistors by comparing device results with high-resolution electron microscopy observations

G. R. Wolstenholme, N. Jorgensen, P. Ashburn and G. R. Booker
Journal of Applied Physics 61 (1) 225 (1987)
https://doi.org/10.1063/1.338861