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Cited article:

STRUCTURAL AND ELECTRONIC PROPERTIES OF CVD SILICON FILMS NEAR THE CRYSTALLIZATION TEMPERATURE

J. Magariño, D. Kaplan, R. Bisaro, J.F. Morhange, K. Zellama

J. Phys. Colloques, 43 C1 (1982) C1-271-C1-276

DOI: https://doi.org/10.1051/jphyscol:1982137

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