The Citing articles tool gives a list of articles citing the current article. The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
This article has been cited by the following article(s):
有机薄膜晶体管陷阱态密度检测研究进展
李尧 Li Yao, 王奋强 Wang Fenqiang, 王爱玲 Wang Ailing, 蓝俊 Lan Jun, 刘良朋 Liu Liangpeng, 吴回州 Wu Huizhou and 张鹏杰 Zhang Pengjie Laser & Optoelectronics Progress 61(13) 1300005 (2024) https://doi.org/10.3788/LOP232085
Quantitative Analysis of the Density of Trap States in Semiconductors by Electrical Transport Measurements on Low-Voltage Field-Effect Transistors
Meyer–Neldel Rule and Extraction of Density of States in Amorphous Indium–Gallium–Zinc-Oxide Thin-Film Transistor by Considering Surface Band Bending
Jaewook Jeong, Jae Kyeong Jeong, Jin-Seong Park, Yeon-Gon Mo and Yongtaek Hong Japanese Journal of Applied Physics 49(3) 03CB02 (2010) https://doi.org/10.1143/JJAP.49.03CB02
Systematic study of light-induced effects in hydrogenated amorphous silicon