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Cited article:

Damage induced by laser irradiation of NiSi2/Si 〈111〉 structures

F. Priolo, M. G. Grimaldi, P. Baeri, E. Rimini and A. La Mantia
Journal of Applied Physics 61 (7) 2522 (1987)
https://doi.org/10.1063/1.337927

Electronically active defects in cw beam‐annealed Si. I. Electron‐beam‐induced current

N. H. Sheng, M. Mizuta and J. L. Merz
Journal of Applied Physics 55 (8) 3072 (1984)
https://doi.org/10.1063/1.333303

Secondary Ion Mass Spectrometry SIMS III

M. Maier, D. Bimberg, H. Baumgart and F. Phillippi
Springer Series in Chemical Physics, Secondary Ion Mass Spectrometry SIMS III 19 336 (1982)
https://doi.org/10.1007/978-3-642-88152-7_51

Luminescence in slipped and dislocation-free laser-annealed silicon

R. H. Uebbing, P. Wagner, H. Baumgart and H. J. Queisser
Applied Physics Letters 37 (12) 1078 (1980)
https://doi.org/10.1063/1.91869