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Cited article:
S. Basavaiah , M. Murakami , C . J . Kircher
J. Phys. Colloques, 39 C6 (1978) C6-1247-C6-1249
This article has been cited by the following article(s):
7 articles
Microstructure of fine-grained Pb-alloy films for Josephson integrated circuits
Yuji Hasumi and Takao Waho Journal of Applied Physics 59 (2) 540 (1986) https://doi.org/10.1063/1.336665
Hillock growth kinetics in thin Pb-In-Au films
H.-C. W. Huang, P. Chaudhari, C. J. Kircher and M. Murakami Philosophical Magazine A 54 (4) 583 (1986) https://doi.org/10.1080/01418618608243615
Strain in evaporated Nb thin films
Masanori Murakami and Tadashi Yogi Journal of Applied Physics 57 (2) 211 (1985) https://doi.org/10.1063/1.334790
Microstructures of lead alloy Josephson junction electrode materials: PbInAu and PbSb
S. Pei, S. Nakahara, H. Schreiber and J. Gates IEEE Transactions on Magnetics 19 (3) 972 (1983) https://doi.org/10.1109/TMAG.1983.1062557
Changes in Microstructures of Pb–In Films during Thermal Cycling between Room and Liquid Helium Temperature
Masanori Murakami Transactions of the Japan Institute of Metals 23 (8) 488 (1982) https://doi.org/10.2320/matertrans1960.23.488
Nb/Nb oxide/Pb-alloy Josephson tunnel junctions
S. Raider and R. Drake IEEE Transactions on Magnetics 17 (1) 299 (1981) https://doi.org/10.1109/TMAG.1981.1060970
Thermal stability of Pb‐alloy Josephson junction electrode materials. I. Effects of film thickness and grain size of Pb‐In‐Au base electrodes
Masanori Murakami Journal of Applied Physics 52 (3) 1309 (1981) https://doi.org/10.1063/1.329757