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Optical characterization of inhomogeneous thin films with randomly rough boundaries
Jiří Vohánka, Ivan Ohlídal, Vilma Buršíková, Petr Klapetek and Nupinder Jeet Kaur Optics Express 30(2) 2033 (2022) https://doi.org/10.1364/OE.447146
Combination of spectroscopic ellipsometry and spectroscopic reflectometry with including light scattering in the optical characterization of randomly rough silicon surfaces covered by native oxide layers
Ivan Ohlídal, Jiří Vohánka, Martin Čermák and Daniel Franta Surface Topography: Metrology and Properties 7(4) 045004 (2019) https://doi.org/10.1088/2051-672X/ab359d
Comparative study of a standard optical steel plate surface using ellipsometry and speckle interferometry
Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh–Rice theory
Photothermal displacement spectroscopy: An optical probe for solids and surfaces
M. A. Olmstead, N. M. Amer, S. Kohn, D. Fournier and A. C. Boccara Applied Physics A Solids and Surfaces 32(3) 141 (1983) https://doi.org/10.1007/BF00616610
Chemistry and Physics of Solid Surfaces IV
G. A. Bootsma, L. J. Hanekamp and O. L. J. Gijzeman Springer Series in Chemical Physics, Chemistry and Physics of Solid Surfaces IV 20 77 (1982) https://doi.org/10.1007/978-3-642-47495-8_4
Expression for the reflectance of randomly rough surfaces derived with the Fresnel approximation