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Cited article:

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High-energy synchrotron x-ray techniques for studying irradiated materials

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Lattice Defects Diffuse Scattering from Thin Films of a Ge-Si System with Low-Energy Ar+ and Xe+ Bombardment During Molecular Beam Epitaxy (MBE) Growth

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Doping mechanisms of tin-doped indium oxide films

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Triple crystal x‐ray diffraction analysis of chemical‐mechanical polished gallium arsenide

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Etude par diffusion de Huang des auto-interstitiels dans un alliage ordonné Fe-40 at % Al irradié aux électrons

J.P. Guillot, J.P. Rivière and M. F. Beaufort-Richard
Journal de Physique 44 (5) 651 (1983)
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