Articles citing this article

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The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Optical analyses of radiation effects in ion-implanted Si: Fractional-derivative-spectrum methods

Xing-Fei He, Ren-Rong Jiang and Dang Mo
Physical Review B 41 (9) 5799 (1990)
https://doi.org/10.1103/PhysRevB.41.5799

Disorder effects on optical spectra and band structure of Si induced by ion implantation

Xing‐Fei He, Ren‐Rong Jiang, Rui‐Xiang Chen and Dang Mo
Journal of Applied Physics 66 (11) 5261 (1989)
https://doi.org/10.1063/1.343714

On the nature of dislocation loops in As‐implanted and postannealed Si wafers

P. Pavlidis, N. A. Economou and A. Christou
Journal of Applied Physics 48 (8) 3612 (1977)
https://doi.org/10.1063/1.324166