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Cited article:

High-energy x-ray diffractometer for nondestructive strain depth profile measurement

M. Y. Al-Shorman, T. C. Jensen and J. N. Gray
Review of Scientific Instruments 84 (12) (2013)
https://doi.org/10.1063/1.4841895

Interference between direct and resonant channels in near-resonance photoemission in argon

R. R. T. Marinho, O. Björneholm, S. L. Sorensen, et al.
Physical Review A 63 (3) 032514 (2001)
https://doi.org/10.1103/PhysRevA.63.032514

Si 2p and 2s resonant excitation and photoionization in SiFg4

T. A. Ferrett, M. N. Piancastelli, D. W. Lindle, P. A. Heimann, and D. A. Shirley
Physical Review A 38 (2) 701 (1988)
https://doi.org/10.1103/PhysRevA.38.701

Energy-dispersive measurements of the Kα_{3}, KM_{1}, Kβ_{1}, and Kβ_{2} x-ray intensities relative to the Kα_{1} intensity in lead and uranium

J. Campbell, P. McGhee, J. Maxwell, R. Ollerhead and B. Whittaker
Physical Review A 33 (2) 986 (1986)
https://doi.org/10.1103/PhysRevA.33.986

Precision measurements of x-ray energies, natural widths and intensities in the actinide region

G. Barreau, H. G. B�rner, T. Egidy and R. W. Hoff
Zeitschrift f�r Physik A Atoms and Nuclei 308 (3) 209 (1982)
https://doi.org/10.1007/BF01418282