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This article has been cited by the following article(s):
Assessment of channel temperature in β-(AlxGa1−x)2O3/Ga2O3 heterostructure field-effect transistors using visible wavelength thermoreflectance thermal imaging
James Spencer Lundh, Georges Pavlidis, Kohei Sasaki, Andrea Centrone, Joseph A. Spencer, Hannah N. Masten, Marc Currie, Alan G. Jacobs, Keita Konishi, Akito Kuramata, Karl D. Hobart, Travis J. Anderson and Marko J. Tadjer Applied Physics Letters 124(5) (2024) https://doi.org/10.1063/5.0177609