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This article has been cited by the following article(s):
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Dark-line defects induced by mechanical bending in GaAs-Ga1−xAlxAs double-heterostructure wafers
Seig^o Kishino, Naoki Chinone, Hisao Nakashima and Ryoichi Ito Applied Physics Letters 29(8) 488 (1976) https://doi.org/10.1063/1.89132