Supplément au Journal de Physique Colloques

GLANCING INCIDENCE X-RAY STUDIES OF TITANIUM NITRIDE THIN FILMS USING A NEW MULTIPURPOSE LABORATORY SPECTROMETER

R.C BUSCHERT, P.N. GIBSON, W. GISSLER, J. HAUPT and T.A. CRABB

J. Phys. Colloques, 50 C7 (1989) C7-169-C7-173

DOI: 10.1051/jphyscol:1989716

R.C BUSCHERT

P.N. GIBSON

W. GISSLER

J. HAUPT

T.A. CRABB

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